BX41M

Olympus BX41M Microscope

	Features			Dimensions

	Specifications			Brochures

Olympus BX41M Specifications

Olympus BX41M

Packed with features for detailed inspection of all electronic devices The BX41M microscope concept brings together all the capabilities needed for thorough inspection of a wide variety of electronic devices and semiconductor components. As well as excellent cost-efficiency, it offers a compact design based on advanced ergonomics and incorporating Olympus' original Y-shaped frame, and simple, straightforward operation. The comprehensive list of features includes top-quality UIS optics backed by a full range of accessories, and an arm-integrated reflected light illuminator for easier component installation and greater overall system flexibility.

BX41M Specifications

Optical System

UIS optical System

Objectives

UIS objectives

Eyepieces

UIS eyepieces

Microscope frame

Illuminator

Reflected light, 6V30W power supply, light preset switch

Focus

	Vertical stage movement: 25mm
	Fine focus movement:100µm
	Minimum graduation: 1µm
	Upper limit stop
	Torque adjustment for coarse adjustment knobs

Maximum specimen height

65mm (w/o spacer)

Observation tube

Widefield (F.N.22)

	Inverted: Binocular, trinocular and tilting observation tubes
	Erect: trinocular and tilting observation tubes

Super widefield (F.N. 26.5)

	Inverted: trinocular observation tube
	Erect: Trinocular and tilting observation tubes

Reflected light illuminator

	BX-KMA
	30W halogen, BF/DIC/KPO

Revolving nosepiece

For BF

	Sextuple, centerable sextuple, septuple revolving nosepieces
	(optional: motorized sextuple)

Stage

	Coaxial stage with left or right hand low drive control,
	with torque adjustment,
	Movement: X=76mm, Y=52mm
	Large-sized coaxial stage with left or right hand low drive control,
	with Y direction locking mechanism Movement:X-110, Y=52mm