Olympus MX51 Semiconductor Inspection Microscope

The Olympus MX51 Effect: More Efficient Inspections Throughout Industry.

Two stage sizes are available, 150mm and 100mm.
The 150mm stage has a built-in clutch lever, which enable quick location of specimens on the stage without diverting the operator’s view, allowing quick, easy inspections.

Control for focusing and light intensity adjustment are placed closer together, so that both can be operated with one and the same hand.

MX51 can be equipped with a range of motorized nosepieces. The external handset allows direct selection of the desired objectives. The MX51 also offers a centerable, motorized nosepiece for accurate positioning for easy observation at high magnifications.

The frame and 6-inch stage are coated to prevent static build-up. *Use special metal plate (BH3-SP6).

The standard sample thickness is 30mm. Insert the intermediate attachment to accommodate thicker samples.

Fast, accurate detection of defects, and hence fewer check failures, are ensured by the MX51’s enhanced brightfield and darkfield observation capabilities, which deliver approximately 4* times greater detection sensitivity than previous model. *In the recommended set of objective lens.